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課程名稱 |
電子材料特論
Special Topics on Electronic Materials |
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開課學期 |
110-2 |
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授課對象 |
工學院 應用力學研究所 |
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授課教師 |
陳建彰 |
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課號 |
AM7154 |
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課程識別碼 |
543 M5250 |
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班次 |
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學分 |
3.0 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期五2,3,4(9:10~12:10) |
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上課地點 |
應109 |
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備註 |
總人數上限：60人 |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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課程概述 |
本學期將從電子材料的基礎-電磁學切入，一開始講解基本電磁學，再引入材料基礎知識、電子材料等等，視時間而定再補充材料分析工具的相關知識(包括SEM、EDS、WDS、XRD、表面分析、熱分析)等等。 |
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課程目標 |
本學期將從電子材料的基礎-電磁學切入，一開始講解基本電磁學，再引入材料基礎知識、電子材料等等，視時間而定再補充材料分析工具的相關知識(包括SEM、EDS、WDS、XRD、表面分析、熱分析)等等。 |
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課程要求 |
General physics,
General chemistry,
Engineering Mathematics |
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
☆★Introduction to Electrodynamics, by D. J. Griffith
☆ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-
Hill 2005. |
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參考書目 |
☆★Introduction to Electrodynamics, by D. J. Griffith
☆★Concepts of Modern Physics, by A. Beiser
☆★Optoelectronics and Photonics, by S. O. Kasap, McGraw-Hill 2001.
☆★Solid State Electronic Devices, by B. G. Streetman, Prentice Hall.
☆★Physics of Solar Cells, by P. Wurfel, Wiley-VCH.
☆★Handbook of Photovoltaic Science and Engineering. Edited by A. Luque and
S. Hegedus, John Wiley & Sons, 2003.
☆ Principles of Electronic Materials and Devices, by S. O. Kasap, McGraw-
Hill 2005.
☆ Engineering Materials 1: An Introduction to Properties, Applications and
Design, by Michael F. Ashby and David R. H. Jones, Elsevier 2005.
☆ Scanning Electron Microscopy and X-ray Microanalysis, R. E. Lee, Prentice-
Hall, 1993.
☆ Elements of X-ray Diffraction, B. D. Cullity, Addison Wesley.
☆ Principles of instrumental analysis, by D. A. Skoog, F. J. Holler, S. R.
Crouch, Belmont, CA: Thomson Brooks/Cole, 2007.
Understanding Materials Science, Rolf E. Hummel, Springer, 1997.
Materials – Engineering, Science, Processing and Design, by M. Ashby, H.
Shercliff, and D. Cebon, Elsevier 2007.
Instrumental Methods of Analysis, H. H. Willard, L. L. Merritt Jr, J. A. Dean,
F. A. Settle Jr., Wadsworth.
Surface analysis techniques and applications, edt by W. Neagle, D. R. Randell,
Cambridge, Royal Society of Chemistry, 1990.
An introduction to surface analysis by XPS and AES, by J. F. Watts and J.
Wolstenholme, New York: J. Wiley, 2003. |
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評量方式
(僅供參考) |
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No. |
項目 |
百分比 |
說明 |
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1. |
小考二至三次 |
70% |
電磁學小考二至三次 |
2. |
期末報告 |
30% |
期末上台報告。本部分將視修課人數進行調整 |
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